Family of Wavefront Sensors For Instant Phase Analysis
The CLAS-2D™ Shack-Hartmann wavefront sensor combines the functions of an interferometer, beam profiler, and beam quality meter in one instrument. The system software analyzes optical aberrations including astigmatism, coma, spherical aberration, focus error/collimation, tilt and more. In addition, the CLAS-2D™ measures M 2 beam quality, MTF, Strehl Ratio, near field and far field beam divergence, and other beam parameters.
Versions are available for both CW and pulsed beams in three wavelength ranges: visible, near IR, and long IR.
Typical wavefront sensor applications are:• Laser beam diagnostics• Optical testing• Alignment• Angular measurement• Collimation• Surface measurement
Nondestructive testing with shearography
About Nondestructive Testing (NDT) by Speckle Interferometry Speckle Interferometry is a common term used for different optical measurement techniques like TV-holography (VibroMap 1000), Shearography (SNT 4045) and other techniques. With these techniques, laser light is used to detect static and/or dynamic displacements of object surfaces with very high sensitivity and accuracy. One main application of Speckle Interferometry is Nondestructive Testing - NDT. Speckle Interferometry is especially useful to detect defects in metallic and/or polymer composite materials. When the object is excited dynamically or statically, surface or sub surface defects can be detected, as many defects give inhomogeneous surface displacements when the object is excited. Typical excitation methods are thermal loading, single frequency vibration, white noise vibration, vacuum or pressure loading, mechanical loading. Typical defects are delaminations and debonds, flaws, impact damage etc. Optonor has long time experience with the use of Speckle Techniques for NDT applications. The Trondheim Group has delivered systems world wide (both TV-holography and Electronic Shearography) for industrial NDT applications. The shearography system SNT 4045 can be customized for different industrial applications, like testing of large ship structures, aircraft structures like fan ducts etc., panels and a long range of other products. In addition, the TV-holography system VibroMap 1000 can also be used for several NDT applications. You are welcome to contact us to get an evaluation of your NDT problems and requirements.
MEMSMap 510
MEMS analysis High frequency vibration measurements Static deflection measurements 3D measurements Surface profiling The MEMSMap 510 is a microscopic TV-holography system which can be used on surfaces down to less than 0.1x0.1 mm (full field). The MEMSMap 510 / MicroMap 5010 can be used for 3 types of measurements}Vibration measurements up to 240 MHz or moreStatic deflection measurements and Surface topography measurements (profiling)The MEMSMap 510 works a similar way to the VibroMap 1000. The MEMSMap can be used on both specular (shiny) objects and rough objects. The MEMSMap 510 can also be delivered with an option for in-plane deflection measurements, but for in-plane measurements, the MEMSMap can be used on rough surfaces only. The main applications for the Optonor MEMSMap 510 system are deformation- and vibration analysis of MicroMany MEMS structures and transducers have their properties and functionality directly connected to their dynamic and semistatic deflection properties, and the MEMSMap 510 is a powerful tool in the development and testing of such structures.
The CLAS-2D™ Shack-Hartmann wavefront sensor combines the functions of an interferometer, beam profiler, and beam quality meter in one instrument. The system software analyzes optical aberrations including astigmatism, coma, spherical aberration, focus error/collimation, tilt and more. In addition, the CLAS-2D™ measures M 2 beam quality, MTF, Strehl Ratio, near field and far field beam divergence, and other beam parameters.
Versions are available for both CW and pulsed beams in three wavelength ranges: visible, near IR, and long IR.
Typical wavefront sensor applications are:• Laser beam diagnostics• Optical testing• Alignment• Angular measurement• Collimation• Surface measurement
Nondestructive testing with shearography
About Nondestructive Testing (NDT) by Speckle Interferometry Speckle Interferometry is a common term used for different optical measurement techniques like TV-holography (VibroMap 1000), Shearography (SNT 4045) and other techniques. With these techniques, laser light is used to detect static and/or dynamic displacements of object surfaces with very high sensitivity and accuracy. One main application of Speckle Interferometry is Nondestructive Testing - NDT. Speckle Interferometry is especially useful to detect defects in metallic and/or polymer composite materials. When the object is excited dynamically or statically, surface or sub surface defects can be detected, as many defects give inhomogeneous surface displacements when the object is excited. Typical excitation methods are thermal loading, single frequency vibration, white noise vibration, vacuum or pressure loading, mechanical loading. Typical defects are delaminations and debonds, flaws, impact damage etc. Optonor has long time experience with the use of Speckle Techniques for NDT applications. The Trondheim Group has delivered systems world wide (both TV-holography and Electronic Shearography) for industrial NDT applications. The shearography system SNT 4045 can be customized for different industrial applications, like testing of large ship structures, aircraft structures like fan ducts etc., panels and a long range of other products. In addition, the TV-holography system VibroMap 1000 can also be used for several NDT applications. You are welcome to contact us to get an evaluation of your NDT problems and requirements.
MEMSMap 510
MEMS analysis High frequency vibration measurements Static deflection measurements 3D measurements Surface profiling The MEMSMap 510 is a microscopic TV-holography system which can be used on surfaces down to less than 0.1x0.1 mm (full field). The MEMSMap 510 / MicroMap 5010 can be used for 3 types of measurements}Vibration measurements up to 240 MHz or moreStatic deflection measurements and Surface topography measurements (profiling)The MEMSMap 510 works a similar way to the VibroMap 1000. The MEMSMap can be used on both specular (shiny) objects and rough objects. The MEMSMap 510 can also be delivered with an option for in-plane deflection measurements, but for in-plane measurements, the MEMSMap can be used on rough surfaces only. The main applications for the Optonor MEMSMap 510 system are deformation- and vibration analysis of MicroMany MEMS structures and transducers have their properties and functionality directly connected to their dynamic and semistatic deflection properties, and the MEMSMap 510 is a powerful tool in the development and testing of such structures.
